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Low cost systems address Wi-Fi test


 
Courtesy of eeProductCenter

The Manufacturer Says ... eeProductCenter's Alex Mendelsohn Says ...
GaGe Announces New NEXUS 802.11 WiFi Testing Systems

Lockport, IL—GaGe, worldwide leader in high-performance data acquisition solutions, has introduced new low-priced 802.11 WiFi Testing Systems. The NEXUS turn-key Wireless Testing Systems provide all signal generation/analysis hardware and software required for complete testing of 802.11 a, b, g, j, and n wireless devices. IEEE 802.11, also known as the WiFi standard, denotes a set of modulation standards developed for Wireless Local Area Networks (WLAN). Design, test and manufacturing engineers have previously had difficulty finding a low-priced testing solution for 802.11 a, b, g, j, and n devices. To meet this requirement, GaGe has developed the NEXUS 802.11 WiFi Testing Systems—a family of turn-key systems that are built upon a foundation of GaGe CompuGen and CompuScope hardware (arbitrary waveform generator and digitizer cards) and software technology, combined with powerful WLAN generation and analysis application software.

GaGe NEXUS 802.11 WiFi Testing Systems are capable of generating complex 802.11 testing signals for up-conversion and transmission as well as acquiring and analyzing received and down-converted 802.11 signals. NEXUS systems can provide an impressive Error Vector Magnitude (EVM) measurement of -45 dB. Compared to the best available transmit/receive wireless devices that typically provide an EVM of -35 dB, GaGe's NEXUS systems therefore provide base performance that is at least 10 dB better than the device under test.

Another important benefit of the NEXUS system is true simultaneous conversion clocking and triggering on all channels. This benefit is a direct result of GaGe's Master/Slave Multi-CompuScope digitizer architecture. Simultaneous timing on multiple channels gives the NEXUS a fundamental advantage for 802.11n Multiple-In/Multiple-Out (MIMO) architectures, where multiple transmitter and receiver antennas are used. Other manufacturers of 802.11 test systems suggest that their single-antenna systems may be combined and used in MIMO architectures, but closer examination often reveals that synchronization between separate channels is minimal or non-existent. GaGe NEXUS WiFi testing systems are available to order immediately with a projected lead-time of 6-8 weeks. Pricing starts at $29,995.00 USD for the US market. For more information please refer to our Web site: http://www.gage-applied.com/Products/turnkey/NEXUS.htm

Enterprises working with the IEEE-802.11 Wi-Fi equipment and modulation standards are crying out for low cost WLAN (wireless local area network) test gear. Meeting this requirement, GaGe Applied Technologies's NEXUS 802.11 WiFi Testing Systems comprise a family of turn-key assemblages built upon the company's existing CompuGen and CompuScope hardware and software.

Significantly for a company known for its high-speed digitizer boards, this product family relies on a software partnership to comprise a test system.

These components are combined with WLAN generation and analysis application software. The system's vector signal generator is an Arbitrary Waveform generator that offers 12-bit resolution at 300-Msamples/s, with 1-Msample of memory/channel.

The output can be set between -20-dBm (22.5-mV) and +10-dBm (10-mW) over a 15-MHz to 100-MHz range. The analyzer section offers 12-bit resolution at 200-Msamples/s. It can accommodate signals over a -10-dBm to +25-dBm (320-mW) range.

Generate And Analyze

The NEXUS 802.11 WiFi Testing Systems are capable of generating IEEE-802.11 testing signals for up-conversion and transmission, as well as acquiring and analyzing received and down-converted IEEE-802.11 signals.

The NEXUS Systems also accept 10-MHz reference signals that are used to sync their conversion clocks to ensure high timing accuracy and stability. To do that, the reference signal is typically derived from a GPS IRIG (Global Positioning System Inter-Range Instrumentation Group) satellite) signal or an atomic clock source.

I/Q Flexibility

Usually, transmitted signals are generated using two analog output waveforms in quadrature (I/Q modulation. Received signals are typically heterodyned down to a lower IF (intermediate frequency). As such, two analog output channels are required for each transmitted wireless signal, and one input channel is required for each received wireless signal.

Addressing that, the NEXUS tester can be configured for various numbers of maximum received and transmitted wireless signals. This permits you to select only those functions needed to accommodate the required number of transmitted and received wireless signals of your design.

When unmodulated signals with a 40-MHz bandwidth are generated and analyzed, an EVM (error vector magnitude) measurement of -45-dB is obtained. According to Gage, the best available Transmit/Receive wireless devices typically provide an EVM of -35-dB. The NEXUS therefore gives you base performance that's at least 10-dB better than the DUT (device under test).

Lyocom Software

Not mentioned in GaGe's press statement (on the left) is the fact that NEXUS systems include Lyocom Inc.'s WLAN Wireless Testing software. Standalone WLAN generation and analyzer software applications let you create and analyze IEEE-802.11 a, b, g, j and IEEE-802.11n signals.

Lyocom's software can control a signal analyzer's phase and amplitude tracking, and accommodate symbol clock recovery. It also handles frequency synchronization, I/Q sweeping, and filter control. A signal analyzer's display can show a constellation diagram, indicate carrier frequency variation, and depict EVM versus symbol content. It can also show channel response, preamble transients, and amplitude variations.

Details Revealed

Reported information can include details about carrier leakage, subcarrier flatness, EVM, data rates, packet lengths, and the number of symbols. Signal generator controls include those for data rate, packet length, preamble types (short or long) and filter controls.

In addition, Gage Supplies National Instruments LabVIEW source code. That lets you integrate this system into LabVIEW applications.

Click here for a datasheet (in Adobe Acrobat .PDF format).

For more details, contact Nicole Faubert or General Manager Eric Gillas at Gage Applied Technologies, 900 N. State Street, Lockport, Ill. 60441. Phone: 514-633-7007 Ext. 3034, or 800-567-GAGE. Fax: 800-780-8411. E-mail: nfaubert@gage-applied.com

Gage Applied Technologies, 800-567-GAGE, www.gage-applied.com





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